发明名称 |
DEVICE FOR MEASURING TEMPERATURE OF PLATE USING TEMPERATURE RESISTANT BODY |
摘要 |
PURPOSE: A device for measuring a temperature is provided to exactly measure the temperature of a hot plate for each position. CONSTITUTION: A device for measuring a temperature of a hot plate comprises of: a test wafer(101) for measuring the temperature of the hot plate; a temperature resistant body(102) formed on a surface of the test wafer(101); and a resistant system(103) displayed a resistant value measured in the temperature resistant body(102). A method for forming the temperature resistant body(102) in the test wafer(101) is deposited a heat insulating layer(104) for cutting a heat on the test wafer(101) by the heat resistant body(102) and a resistant layer(105) is deposed on the heat insulating layer(104). The heat insulating layer(104) is used materials such as an SiO2 and an SiN2, and the resistant layer(105) is used a polysilicon. The temperature resistant body(102) is measured the temperature of the hot plate in various points by forming many temperature resistant bodies on the test wafer(101), but is formed so a resistance as to be concentrated in a certain part of the hot plate measured the temperature.
|
申请公布号 |
KR20000032278(A) |
申请公布日期 |
2000.06.05 |
申请号 |
KR19980048682 |
申请日期 |
1998.11.13 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
AN, YEONG BAE |
分类号 |
G01K7/00;(IPC1-7):G01K7/00 |
主分类号 |
G01K7/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|