发明名称 METHOD FOR CLEANING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for cleaning a semiconductor device is provided to effectively remove a remained organic matter to improve reliability of a device. CONSTITUTION: A method for cleaning a semiconductor device includes steps of spray ingnitrogen gases of a low temperature to a wafer(23), which is loaded on a susceptor(22), using a gas spray nozzle(25) in a chamber(21) to cool the wafer and generating a plasma using the sprayed nitrogen gases and sputtering.
申请公布号 KR20000030975(A) 申请公布日期 2000.06.05
申请号 KR19980045987 申请日期 1998.10.29
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 LEE, GYOUNG BOK;LEE, WOO BONG
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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