发明名称 |
METHOD FOR CLEANING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for cleaning a semiconductor device is provided to effectively remove a remained organic matter to improve reliability of a device. CONSTITUTION: A method for cleaning a semiconductor device includes steps of spray ingnitrogen gases of a low temperature to a wafer(23), which is loaded on a susceptor(22), using a gas spray nozzle(25) in a chamber(21) to cool the wafer and generating a plasma using the sprayed nitrogen gases and sputtering.
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申请公布号 |
KR20000030975(A) |
申请公布日期 |
2000.06.05 |
申请号 |
KR19980045987 |
申请日期 |
1998.10.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
LEE, GYOUNG BOK;LEE, WOO BONG |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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