| 摘要 |
<p>There is disclosed an integrated circuit which allows for ease of testing thereof, and a method of such testing. The integrated circuit includes a linear shift register without feedback, which converts signals on a bus into a serial bitstream. The integrated circuit has an output pin connected to the linear shift register to receive the serial bitstream thereon. The method of testing the chip includes supplying test inputs to the chip, reading the serial bitstream data during the test from an output pin of the integrated circuit, and comparing the output data in a test device with an expected bitstream. This has the advantage that the signals on the bus under investigation can be monitored continually throughout the test. In the event that a fault is discovered, the test can be terminated much more quickly than when using a device which requires the test to be completed before any data can be read out.</p> |
