发明名称 Device for adjusting space between chip in semiconductor chip tester
摘要 Device for adjusting a space between chips in a semiconductor chip tester, is disclosed, including a carrier plate mounted movable along a horizontal guide rail, a mounting plate fixed to the carrier plate, an elevating plate mounted on the mounting plate movable in up and down direction by a vertical LM (linear motion) guider, a cam shaft rotatably mounted on the elevating plate, the cam shaft having a plurality of cam grooves formed in a radial direction in an outer circumferential surface, a driving mechanism for rotating the cam shaft, and a plurality of pick-up members each fitted movable in a horizontal direction by a horizontal LM guider in a state a top of each of the pick-up members is inserted in one of the cam grooves.
申请公布号 US6068317(A) 申请公布日期 2000.05.30
申请号 US19980164017 申请日期 1998.09.30
申请人 MIRAE CORPORATION 发明人 PARK, WOO YEOL
分类号 G01R31/26;H01L21/66;H01L21/68;(IPC1-7):B65B35/38 主分类号 G01R31/26
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