发明名称 |
Mask structure and mask holding mechanism for exposure apparatus |
摘要 |
A mask holding system includes a chucking mechanism for holding a mask structure including a frame and a mask substrate having a rectangular window with a mask pattern, and a load mechanism for applying, at a position along an extension of a diagonal of the rectangular window, a load to the frame in a direction along the plane of the mask, whereby the mask pattern can be distorted isotropically with the application of the load along the mask plane.
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申请公布号 |
US6069931(A) |
申请公布日期 |
2000.05.30 |
申请号 |
US19980030081 |
申请日期 |
1998.02.25 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
MIYACHI, TAKESHI;HARA, SHINICHI |
分类号 |
G03F1/14;G03F7/20;(IPC1-7):H01L21/30 |
主分类号 |
G03F1/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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