发明名称 Mask structure and mask holding mechanism for exposure apparatus
摘要 A mask holding system includes a chucking mechanism for holding a mask structure including a frame and a mask substrate having a rectangular window with a mask pattern, and a load mechanism for applying, at a position along an extension of a diagonal of the rectangular window, a load to the frame in a direction along the plane of the mask, whereby the mask pattern can be distorted isotropically with the application of the load along the mask plane.
申请公布号 US6069931(A) 申请公布日期 2000.05.30
申请号 US19980030081 申请日期 1998.02.25
申请人 CANON KABUSHIKI KAISHA 发明人 MIYACHI, TAKESHI;HARA, SHINICHI
分类号 G03F1/14;G03F7/20;(IPC1-7):H01L21/30 主分类号 G03F1/14
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