发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent the additional functions of a semiconductor device from being failed when a pressure is given to a pressure sensor by providing at least one sensor to work together with a semiconductor chip so that a pressure working on a semiconductor chip is measured indirecly. SOLUTION: A position sensor functioning with a semiconductor chip 2 is formed to measure indirectly a pressure working on the semiconductor chip 2. The position sensor is provided with a capacitor provided with two electrodes 6 and 7, in which the electrode 6 is formed of a substrate of semiconductor chip and the electrode 7 is formed of conductive area. When a pressure in a sample chamber exceeds an allowable value, the backside of the semiconductor chip is brought into contact with the electrode 7 and it is supported thereby or on the bottom of a casing 5. If the electrodes 6 and 7 are brought into contact with each other, a current therebetween can be detected and evaluated to control the pressure in the sample chamber.
申请公布号 JP2000150914(A) 申请公布日期 2000.05.30
申请号 JP19990325634 申请日期 1999.11.16
申请人 MICRONAS INTERMETALL GMBH 发明人 IGEL GUENTER
分类号 H01L29/84;G01L9/00;(IPC1-7):H01L29/84 主分类号 H01L29/84
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