发明名称 Semiconductor device
摘要 A semiconductor device of the present invention includes a comparator including a detection side circuit to which a detection voltage is supplied and a reference side circuit to which a reference voltage is supplied. A detection element for obtaining the detection voltage is provided inside the semiconductor device, and a reference element for obtaining the reference voltage is provided outside the semiconductor device. At least one of the detection side circuit and the reference side circuit includes a temperature dependent adjustment element for reducing a difference between a temperature characteristic of the detection voltage and a temperature characteristic of the reference voltage.
申请公布号 US6069501(A) 申请公布日期 2000.05.30
申请号 US19980059214 申请日期 1998.04.13
申请人 MATSUSHITA ELECTRONICS CORPORATION 发明人 HACHIYA, YOSHIAKI;YAMANISHI, YUJI;MORI, YOSHIHIRO
分类号 G01R19/165;H01L23/34;H03F3/45;H03K5/08;H03K5/24;H03K17/14;(IPC1-7):H01L35/00 主分类号 G01R19/165
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