发明名称 |
Semiconductor device |
摘要 |
A semiconductor device of the present invention includes a comparator including a detection side circuit to which a detection voltage is supplied and a reference side circuit to which a reference voltage is supplied. A detection element for obtaining the detection voltage is provided inside the semiconductor device, and a reference element for obtaining the reference voltage is provided outside the semiconductor device. At least one of the detection side circuit and the reference side circuit includes a temperature dependent adjustment element for reducing a difference between a temperature characteristic of the detection voltage and a temperature characteristic of the reference voltage.
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申请公布号 |
US6069501(A) |
申请公布日期 |
2000.05.30 |
申请号 |
US19980059214 |
申请日期 |
1998.04.13 |
申请人 |
MATSUSHITA ELECTRONICS CORPORATION |
发明人 |
HACHIYA, YOSHIAKI;YAMANISHI, YUJI;MORI, YOSHIHIRO |
分类号 |
G01R19/165;H01L23/34;H03F3/45;H03K5/08;H03K5/24;H03K17/14;(IPC1-7):H01L35/00 |
主分类号 |
G01R19/165 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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