发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To get higher crystal property than the crystal property obtained in heat treatment, by introducing a catalyst element while controlling the quantity, and minimizing the quantity, and making the method the one high in productivity, in the manufacture of a film silicon semiconductor which has crystal property by the heat treatment under 600 deg.C using a catalyst element. SOLUTION: This is a semiconductor device which has a substrate 11 and a crystalline silicon film, and the substrate 11 has an insulating surface, and the above crystalline silicon film is provided above the above-mentioned insulating surface, and the above crystalline silicon film is one which is irradiated with a laser beam or strong light after bringing an element for accelerating crystallization or a compound 14 including that element into contact with the amorphous silicon film 12 and heating this amorphous silicon film 12 for crystallization.
申请公布号 JP2000150381(A) 申请公布日期 2000.05.30
申请号 JP19990317551 申请日期 1999.11.08
申请人 SEMICONDUCTOR ENERGY LAB CO LTD;SHARP CORP 发明人 OTANI HISASHI;MIYANAGA SHOJI;CHO KOYU;YAMAGUCHI NAOAKI;SUZUKI ATSUNORI
分类号 H01L21/205;H01L21/20;H01L21/336;H01L29/786;H01L31/10;(IPC1-7):H01L21/20 主分类号 H01L21/205
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