发明名称 CATHODE ELECTRODE FOR WAFER PLATING AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To allow no contaminant to enter a wafer in plating by, related to a cathode electrode for wafer plating, forming a base layer from Ti, and forming a wafer contact layer from the one selected among TiN, WN, TaN, W, or Ta on the base layer. SOLUTION: Related to a cathode electrode 6 for wafer plating, Ti is molded into ring shape to form a base layer 8, a part of the molded Ti base layer 8 which does not contact the edge end of a wafer is masked, and a wafer adhesive layer 9 is laminated from the one selected among TiN, WN, TaN, W, or Ta by sputtering. Related to the cathode electrode 6 for wafer plating, the edge and part of wafer is made to contact the wafer adhesive layer 9 with the Ti base layer 8 below, and a plating current is supplied to the wafer through an electrode terminal connected to a supply source.
申请公布号 JP2000150558(A) 申请公布日期 2000.05.30
申请号 JP19980324986 申请日期 1998.11.16
申请人 ELECTROPLATING ENG OF JAPAN CO 发明人 ISHIDA HIROBUMI
分类号 H01L21/60;C25D17/10;(IPC1-7):H01L21/60 主分类号 H01L21/60
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