| 摘要 |
A contour following tool for preparing the surface of a workpiece is disclosed. The tool has axially shiftable pins that are biased toward a position in which they are fully extended from a housing. As the tool is moved relative to the workpiece, changes in the contoured surface of the workpiece are accommodated by allowing the pins to shift back from their fully extended position against the biasing force. The pins may be biased by a fluid under pressure or by springs. The tool may be used with a wiping cloth or end caps that may apply a cleaning fluid that is applied either externally or internally through the tool through a bore formed in one or more of the pins. A method of cleaning a contoured workpiece is also disclosed.
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