发明名称 Method for growing high-quality crystalline Si quantum wells for RTD structures
摘要 A method of forming a crystalline silicon well over a perovskite barrier layer, preferably for use in formation of a resonant tunneling diode. A silicon substrate (1) is provided of predetermined crystallographic orientation. A layer of crystallographic perovskite material (5) is formed over the silicon substrate and substantially matched to the lattice constant of the silicon substrate. A layer of crystallographic silicon (7) is formed over the perovskite layer substantially matched to the lattice constant of the perovskite layer. The perovskite layer is formed by the steps of placing the silicon substrate in a chamber and then evaporating a layer of barium strontium oxide (3) thereon with a thickness of from about three to about six Angstroms and then evaporating a layer of calcium strontium titanate (5) thereon having a thickness of from about six to about 25 Angstroms thereon in the case of a tunneling diode. A second layer of silicon oxide (9) is provided on the layer of silicon remote from the perovskite layer.
申请公布号 US6069368(A) 申请公布日期 2000.05.30
申请号 US19980211948 申请日期 1998.12.15
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 WILK, GLEN D.;ANTHONY, JOHN M.
分类号 H01L21/20;H01L29/88;(IPC1-7):H01L29/06 主分类号 H01L21/20
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