Sharpened, oriented contact tip structures

摘要

Improved interconnection elements and tip structures for effecting pressure connections between terminals of electronic components are described. The tip structure (20) of the present invention has a sharpened blade (22) oriented on the upper surface of the tip structure (20) such that the length of the blade (22) is substantially parallel to the direction of horizontal movement of the tip structure (20) as the tip structure deflects across the terminal of an electronic component. In this manner, the sharpened substantially parallel oriented blade (22) slices cleanly through any non-conductive layer(s) on the surface of the terminal and provides a reliable electrical connection between the interconnection element and the terminal of the electrical component. One embodiment encompasses a blade oriented at an angle such that the length of the blade is within approximately 45° of the axis parallel to the horizontal movement of the tip structure as the tip structure deflects across the surface of the terminal of the electronic component under test.