发明名称 DEVICE AND METHOD FOR INSPECTING LIQUID CRYSTAL DRIVE SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To secure sufficient writing time without reducing throughput by picking up the surface image of an electro-optic element plate, adding and generating images over a plurality of frames during each polarity period of a bias voltage, and identifying the failed part of a pixel electrode. SOLUTION: An image-processing device generates an image to be inspected to be subjected to image processing by adding continuous four-frame voltage images up to frames A-D related to the surface of a modulator. In this case, a bias voltage EB is set to a negative polarity, for example, during the image pick-up period of A and C frames and a data voltage ED of each frame is set to a completely different value. The voltage ED is set to values that differ from a specific voltage Ea in the frame A. The voltage ED is set to a value where a voltageΔea is added to the voltage Ea in the frame A, a value where a voltageΔeb is added to the voltage Ea in the frame B, a value where a voltageΔec is subtracted from the voltage Ea in the frame C, and a value where a voltageΔed is subtracted from the voltage Ea in the frame D.
申请公布号 JP2000146754(A) 申请公布日期 2000.05.26
申请号 JP19980315209 申请日期 1998.11.05
申请人 ISHIKAWAJIMA HARIMA HEAVY IND CO LTD 发明人 KURIYAMA SHIGEYUKI;ISHIHARA TERUMASA
分类号 G01R31/00;G01M11/00;G01N21/88;G01N21/956;(IPC1-7):G01M11/00 主分类号 G01R31/00
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