发明名称 MULTI-AXIS SYSTEM INCLINOMETER FOR MEASURING INCLINATION AND INCLINATION CHANGE
摘要 PROBLEM TO BE SOLVED: To enable inclination measurement of high precision in a wide measuring range in the case of fine measurement, and reduce constituent cost. SOLUTION: One of fiber rasters 16, 17 composed of parallel fibers 8, 9 is formed on each of two diaphragms 10 and 11, and light sources 6, 7 for irradiating the diaphragms 10, 11 are arranged. The two diaphragms 10, 11 are in a positional relation perpendicular to a liquid 4 surface, and arranged in parallel perpendicular to an imagery surface 18 provided with CCD rows 12a. Both of the filaments 8, 9 form an angle, and its half angle is perpendicular to the imagery surface 18. The filament rasters arranged at intervals are subjected to total reflection from a liquid horizontal line 2, pass a plano-convex lens 13, and form the images on the CCD rows 12a.
申请公布号 JP2000146574(A) 申请公布日期 2000.05.26
申请号 JP19990310807 申请日期 1999.11.01
申请人 CARL ZEISS JENA GMBH 发明人 FEIST WIELAND
分类号 G01C9/06;G01C9/20;(IPC1-7):G01C9/06 主分类号 G01C9/06
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