发明名称 IN-CIRCUIT TESTER FIXTURE TESTING JIG
摘要 PROBLEM TO BE SOLVED: To instantaneously detect a defective part of an in-circuit fixture and efficiently test a printed board by testing the continuity for the entire fixture, before testing the printed board under test. SOLUTION: Test data are transferred from an in-circuit tester 7 through a fixture 3 to a printed board 1 under test to test the poor soldering of mounted electric components 2, etc., the wrong mounting of the components and the breaking of wirings. The fixture 3 connects a probe pin 4 which is fixed to a pin bed 5 to a probe pin 15 fixed to an interface board 6 through a fixture inner wiring 8 to transfer test data from the circuit tester 7 to the printed board 1 under test. The entire top face of an in-circuit tester fixture test jig is a Cu plate, so that all the probe pins assume the same potential when they make contact with a pad underneath the fixture.
申请公布号 JP2000147001(A) 申请公布日期 2000.05.26
申请号 JP19980318663 申请日期 1998.11.10
申请人 HITACHI LTD 发明人 ARIGA SEIGO
分类号 G01R1/06;(IPC1-7):G01R1/06 主分类号 G01R1/06
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