发明名称 MANUFACTURE OF THIN COMPOUND FILM
摘要 <p>PROBLEM TO BE SOLVED: To effectively prevent the dissipation of a chalcogenite element during film formation and to obviate the necessity of heat treatment, selenizing treatment, sulfidizing treatment, or the like, after film formation. SOLUTION: At the time of depositing a thin film of chalcophylite type compound on a substrate by vacuum vapor deposition or sputtering, a thin compound film during deposition is irradiated with a first ion beam containing an chalcogenite element (Se or S) at <=300 V accelerating voltage. Simultaneously, the thin film is also irradiated whit a second ion beam consisting of a rare gas element (Ar, Kr, Xe, or the like) having larger mass than Ne at 100-300 V accelerating voltage.</p>
申请公布号 JP2000144377(A) 申请公布日期 2000.05.26
申请号 JP19980321147 申请日期 1998.11.11
申请人 FUJIKURA LTD 发明人 TANABE NOBUO;OKADA KENICHI
分类号 H01L31/04;C23C14/06;C23C14/22;(IPC1-7):C23C14/06 主分类号 H01L31/04
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