X-RAY DIFFRACTOMETER

摘要

PROBLEM TO BE SOLVED: To irradiate a sample with an incident X-ray of optional wave-length to easily conduct various kinds of X-ray diffraction measurement, by using continuous X-rays generated from an X-ray tube. SOLUTION: Continuous X-rays emitted from an X-ray tube 7 are taken out as a parallel X-ray beam using a capillary bundle 1, and the X-ray of specified wave-length (i.e., specified energy) is taken out from the parallel X-ray beam using a monochromater 8 to irradiate a sample S. A diffracted X-ray generated in the sample S is converged by a solar slit 9 to be received by an X-ray detector 10.