发明名称 THERMAL INFRARED DETECTING ELEMENT WITH TILTED DIAPHRAGM STRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide a thermal infrared detecting element which is provided with a spectral characteristic which is nearly flat with respect to a wavelength band which is longer than a certain wavelength. SOLUTION: This thermal infrared detecting element is composed of a lower- layer part which is composed of a substrate 2 comprising a total reflection coating 1. In addition, it is composed of an upper-layer part which is composed of a diaphragm 10 comprising a bolometer thin film 5 and an infrared absorption film 7 which are surrounded by an insulating protective film 3 and an insulating protective film 6. The upper-layer part is supported by a plurality of beams 12, 12' by keeping an interval from the lower-layer part. Ends, on one side, of the respective beams are fixed to a bank 16, their ends on the other side are connected to the diaphragm via a connection part 13 and a connection part 13', and the diaphragm is supported between the connection parts 13, 13'. The respective beams are deformed by an internal stress due to the difference in a coefficient of thermal expansion and in a molding temperature so as to generate a warp. The diaphragm 10 is tilted with respect to the lower-layer part.
申请公布号 JP2000146684(A) 申请公布日期 2000.05.26
申请号 JP19980322315 申请日期 1998.11.12
申请人 NEC CORP 发明人 ODA NAOKI;KANZAKI MASAYUKI
分类号 G01J1/02;H01L27/14;(IPC1-7):G01J1/02 主分类号 G01J1/02
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