发明名称 |
METHOD OF FORMING CONTACT AND SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method is provided to form a contact between a diffusion area and a gate conductor on a substrate able to offer a direct low resistive contact between devices on a semiconductor chip without leaking current excessively. CONSTITUTION: A method comprising: preparing a silicon-on insulator substrate(105); forming gate stacks(115,117) including poly silicon layers(120,122) on the substrate; forming side wall spacers(610,620) on the side wall of the gate stacks; forming a diffusion area close to the gate stacks; selectively removing the side wall spacer to form a contact; depositing titanium on the poly silicon layers and the diffusion area; annealing the titanium to form a titanium silicide(145) at a portion contacting to the poly silicon layers and the diffusion area; and removing the non-reacting portion of the titanium.
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申请公布号 |
KR20000028642(A) |
申请公布日期 |
2000.05.25 |
申请号 |
KR19990038248 |
申请日期 |
1999.09.09 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
ALLEN ARCHIBALD J.;HURUKAWA TOSHIHARU;O'NEIL EDWARD F.;HEICHAE MARK C.;BURHELST ROGER A.;HORACK DAVID V. |
分类号 |
H01L21/336;H01L21/768;H01L27/11;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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