发明名称 |
DEVICE FOR ETCHING USED TO PRODUCTION OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A device for etching is provided to improve the etching uniformity with controlling the temperature for each part needed a chuck by equipping a first-a third cooling supply ports, a first-a third cooling line and a first-a third cooling return ports. CONSTITUTION: An etching device is arranged a chamber(21) and a chuck(23) put a wafer inside the chamber(21). A support bar(25) is formed in the upper face of the chuck(23), a first-a third cooling supply ports(27a-27c), a first-a third cooling lines(29a-29c) connected each in the first-the third cooling supply ports(27a-27c), and a first and a third cooling return ports(31a-31c) connected each in the first-the third cooling lines(29a-29c) are formed in the support bar(25). A dividing bar(33) is formed to divide between the first-the third cooling lines(29a-29c). The dividing bar is able to be composed of a space. A cooling medium passed the first-the third cooling support ports(27a-27c) is exhausted through the first-the third cooling return ports(31a-31c) after cooling the chuck(23) during moving according to the first-the third cooling lines(29a-29c) to an arrow direction. Therefore, the etching uniformity is increased by rising/falling the different of etching speed of a center part and an edge part of the chuck(23) and the temperature of the chuck through the first-the third cooling lines(29a-29c).
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申请公布号 |
KR20000028129(A) |
申请公布日期 |
2000.05.25 |
申请号 |
KR19980046266 |
申请日期 |
1998.10.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, SHIN HYEON;PARK, JIN HO |
分类号 |
H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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