发明名称 OFFSET DRAIN FERMI-THRESHOLD FIELD EFFECT TRANSISTORS
摘要 An offset drain Fermi-threshold field effect transistor (Fermi-FET) includes spaced apart source and drain regions in an integrated circuit substrate, an d a Fermi-FET channel in the integrated circuit substrate, between the spaced apart source and drain regions. A gate insulating layer is on the integrated circuit substrate between the spaced apart source and drain regions, and a gate electrode is on the gate insulating layer. The gate electrode is closer to the source region than to the drain region. Stated differently, the drain region is spaced farther away from the gate electrode than the source region . The offset drain Fermi-FET can introduce a drift region between the drain region and the Fermi-FET channel that can provide the high voltage and/or hi gh frequency Fermi-FETs, while retaining the Fermi-FET advantages in the channe l.
申请公布号 CA2346416(A1) 申请公布日期 2000.05.25
申请号 CA19992346416 申请日期 1999.11.04
申请人 THUNDERBIRD TECHNOLOGIES, INC. 发明人 DENNEN, MICHAEL W.;RICHARDS, WILLIAM R., JR.
分类号 H01L29/43;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/43
代理机构 代理人
主权项
地址