PHANTOM FOR MEASURING THE CHARACTERISTICS OF SLICES OF AN X-RAY COMPUTERISED TOMOGRAPH

摘要

The invention relates to a phantom for measuring slice thicknesses, slice sensitivity profiles and the axial modulation transfer function (MTF) of an X-ray computerised tomograph. The phantom contains a film (1) formed of a material which tremendously weakens the X-rays. Said film is arranged parallel to the image plane (BE) of the X-ray computerised tomograph when the phantom is used and has an axial extension which is small compared to the thinnest slice to be measured. In a preferred embodiment, the extension of the film (1) in the direction of the image plane (BE) is in the range of a few millimeters.