发明名称 |
POSITIVE ELECTRONIC BEAM AND X-RAY RESIST COMPOSITION |
摘要 |
PURPOSE: A positive electronic beam and X-ray resist composition are provided to improve developing defect by providing a rectangular pattern profile of high quality with high dissolution capability. CONSTITUTION: A positive electronic beam or X-ray resist composition is composed of a compound capable of generating an acid by the illumination of electronic beam or X-ray, a resin having a radical dissolved by the action of an acid and increasing solubility in alkali developing solution, a resin insoluble in water and soluble in alkali developing solution, and a fluoric and/or silicon surface-active agent. The compound capable of generating an acid by the illumination of electronic beam or X-ray is the compound generating a benzene sulfonic acid, a naphthalene sulfonic acid and an antrasen sulfonic acid displaced by at least one radical having at least one fluoric atom and/or at least one fluoric atom.
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申请公布号 |
KR20000029118(A) |
申请公布日期 |
2000.05.25 |
申请号 |
KR19990044865 |
申请日期 |
1999.10.16 |
申请人 |
FUJI PHOTO FILM CO., LTD. |
发明人 |
KODAMA KUNIHIKO;AOAI TOSHIAKI;UENI SIKAJUYA |
分类号 |
H01L21/027;C08F12/22;G03F7/004;G03F7/039;(IPC1-7):G03F7/039 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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