| 摘要 |
PURPOSE: A semiconductor memory device is provided to allow evaluation of input/output terminal dependency of noise characteristics at the time of data output. CONSTITUTION: A semiconductor memory device having a test mode and an operation mode includes a plurality of output buffers(11,13,15). When the semiconductor memory is set at the test mode, at least one of the output buffers(11,13,15) is activated by a test mode circuit(22) in response to an address signal input. Each of the output buffers(11,13,15) includes an input/output terminal(2). The memory device further includes a substrate voltage supplier. In the test mode, the substrate voltage supplier supplies a voltage different from that in the operation mode.
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