METHOD AND INSTALLATION FOR FAST FAULT LOCALIZATION IN AN INTEGRATED CIRCUIT

摘要

The invention concerns a method and an installation for fast fault localization in an integrated circuit, which consists in: generating a sequence of localizing vectors NRZ; determining the abnormal localizing vectors for which the energy consumption value at rest IDDQ is abnormal; producing at least a set of images with an abnormal localizing vector; and comparing at least an abnormal vector image with a reference image.