发明名称 |
METHOD OF PREPARING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A semiconductor device preparing method is provided to shorten the time for a thermal treatment like a hydrogen sintering treatment after a metal wire formation and to keep the electrical property. CONSTITUTION: A semiconductor device preparing method comprises the steps of: installing wafers having MOS type semiconductor by using a device for providing by one sheet on a processing device by every one sheet; raising the temperature of wafers to a certain temperature by inducing hydrogen in the device when performing a hydrogen sintering treatment; performing the hydrogen sintering treatment if the temperature of the wafer becomes the certain temperature; falling the temperature under the certain temperature in a thermal treatment device; and taking the wafers. The sintering is performed within 3 minutes such that a throughput is elevated, the thermal sensitivity of the wafers and the uniformity of the temperature come to be better. A damage of a preliminary process such as MOS interface level is recovered at a short time.
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申请公布号 |
KR20000029158(A) |
申请公布日期 |
2000.05.25 |
申请号 |
KR19990045188 |
申请日期 |
1999.10.19 |
申请人 |
MATSUSHITA ELECTRONICS CORPORATION |
发明人 |
TAKAMORI YOSHINORI;NISHIWAKI TORU |
分类号 |
H01L21/302;H01L21/28;H01L21/3065;H01L21/324;H01L21/768;H01L29/78;(IPC1-7):H01L21/324 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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