发明名称 METHOD OF PREPARING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A semiconductor device preparing method is provided to shorten the time for a thermal treatment like a hydrogen sintering treatment after a metal wire formation and to keep the electrical property. CONSTITUTION: A semiconductor device preparing method comprises the steps of: installing wafers having MOS type semiconductor by using a device for providing by one sheet on a processing device by every one sheet; raising the temperature of wafers to a certain temperature by inducing hydrogen in the device when performing a hydrogen sintering treatment; performing the hydrogen sintering treatment if the temperature of the wafer becomes the certain temperature; falling the temperature under the certain temperature in a thermal treatment device; and taking the wafers. The sintering is performed within 3 minutes such that a throughput is elevated, the thermal sensitivity of the wafers and the uniformity of the temperature come to be better. A damage of a preliminary process such as MOS interface level is recovered at a short time.
申请公布号 KR20000029158(A) 申请公布日期 2000.05.25
申请号 KR19990045188 申请日期 1999.10.19
申请人 MATSUSHITA ELECTRONICS CORPORATION 发明人 TAKAMORI YOSHINORI;NISHIWAKI TORU
分类号 H01L21/302;H01L21/28;H01L21/3065;H01L21/324;H01L21/768;H01L29/78;(IPC1-7):H01L21/324 主分类号 H01L21/302
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