| 摘要 |
PURPOSE: A nonvolatile semiconductor memory integrated circuit is provided to proceed rapidly, exactly and simplify a series of process associated with the burn-in test. CONSTITUTION: A nonvolatile semiconductor memory IC(Integrated Circuit)(60) equipped with a flash memory(11) and CPU(21) comprises a mask ROM(61) having the program code of the CPU(21) and SRAM(Static Random Access Memory)(62) used for temporary memory by the CPU(21). Accessing the flash memory(11), the CPU(21) proceeds a process(61a) to proceed the test whether it is good or not, a process(61a) to temporarily retreat the status(62a) of the result to the SRAM(62) and a process(61a) to convert and record the status(62a) of the result to the flash memory(11) from the SRAM(62).
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