Structure to improve the reliability of organic and polymer light emitting devices and method for producing same

摘要

An organic light emitting device (100, 110, 120) having a process compatible current self-limiting (CSL) structure (105, 115, 125) applied in the vicinity of an electrode (102, 112, 122, 108, 118, 128) of the device prevents the occurrence of high current flow in the vicinity of a short (134) within the device. Should a short (134) occur, the CSL structure (105, 115, 125) becomes resistive, or non-conducting in the vicinity of the short (134), thus preventing the occurrence of "runaway" current in the vicinity of the short (134). By limiting the current flow between conductors in the device, the non-emissive areas of the device can be minimized, thus improving the overall reliability of the device.