| 摘要 |
PCT No. PCT/EP94/04305 Sec. 371 Date Nov. 27, 1996 Sec. 102(e) Date Nov. 27, 1996 PCT Filed Dec. 24, 1994 PCT Pub. No. WO95/18952 PCT Pub. Date Jul. 13, 1995In order to measure the roughness of the surface of a material, in particular of a paper web, the surface of the material is illuminated with a parallel bundle of light beams and the scattering ellipse of the reflected light is evaluated. According to the invention, on optically rough surfaces the evaluation with respect to the scattering ellipse is done in a direction deviating from the major axis of the scattering ellipse.
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