发明名称 Method of removing carbon contamination on semiconductor substrate
摘要 A method of removing carbon contamination. On a semiconductor substrate having carbon contamination thereon, a sacrificial oxide layer is formed. During the formation of the sacrificial oxide layer, an agent is introduced to help and improve the growth of the sacrificial oxide layer, and to trap the carbon contamination. The sacrificial oxide layer is then removed, and the carbon contamination is removed with the sacrificial oxide layer.
申请公布号 US6066572(A) 申请公布日期 2000.05.23
申请号 US19990241338 申请日期 1999.02.01
申请人 UNITED SEMICONDUCTOR CORP. 发明人 LU, LE-YEN;SHEU, YAU-KAE
分类号 H01L21/28;H01L21/306;H01L21/311;H01L21/316;(IPC1-7):H01L21/02 主分类号 H01L21/28
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