发明名称 PROBE COVER
摘要 PROBLEM TO BE SOLVED: To hygienically and inexpensively manufacture a probe cover, assure measurement accuracy and improve the operability of removing. SOLUTION: This probe cover consists of a top flat surface 5 forming an IR transmission window 7 and a tapered part 6 and is composed of a hollow projecting part 2 and a flat part 4 which is successively disposed like a flange at the base part 3 of this projecting part 2 and has an area extremely larger than the area of the top flat surface 5. The hollow part of the projecting part 2 is mounted at the front end 12a of the probe 12 at the time of mounting. Next, a ring 13 is inserted from above and this ring 13 is fitted to the base part 12b of the probe 12, by which the probe cover 1 is fixed to the probe 12. The outer peripheral edge 4a of the flat part 4 protrudes largely outward from the base part 12b of the probe 12 in this state.
申请公布号 JP2000139848(A) 申请公布日期 2000.05.23
申请号 JP19980317504 申请日期 1998.11.09
申请人 OMRON CORP 发明人 OKAMOTO SATOSHI;MATSUDA HISAOMI
分类号 A61B5/01;A61B5/00;(IPC1-7):A61B5/00 主分类号 A61B5/01
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