发明名称 COPPER CHEMICAL-MECHANICAL POLISHING PROCESS USING A FIXED ABRASIVE POLISHING PAD AND A COPPER LAYER CHEMICAL-MECHANICAL POLISHING SOLUTION SPECIFICALLY ADAPTED FOR CHEMICAL-MECHANICAL POLISHING WITH A FIXED ABRASIVE PAD
摘要 The invention comprises copper chemical-mechanical polishing processes using fixed abrasive polishing pads, and copper layer chemical-mechanical polishing solutions specifically adapted for chemical-mechanical polishing with fixed abrasive pads. In one implementation, processes are described for pH's of 7.0 or greater. In one implementation, processes are described for pH's of 7.0 or less. In one implementation, a copper layer chemical-mechanical polishing solution specifically adapted for chemical-mechanical polishing with a fixed abrasive pad comprises a copper oxidizing component present at from about 1 % to 15 % by volume, a copper corrosion inhibitor present at from about 0.01 % to 2 % by weight, and a pH of less than or equal to 7.0. In one implementation, a copper layer chemical-mechanical polishing solution specifically adapted for chemical-mechanical polishing with a fixed abrasive pad comprises a copper oxidizing component present at from about 0.1 % to 15 % by volume, a copper complexing agent present at from about 0.1 % to 15 % by volume, and a pH of greater than or equal to 7.0.
申请公布号 WO0028586(A2) 申请公布日期 2000.05.18
申请号 WO1999US27034 申请日期 1999.11.10
申请人 MICRON TECHNOLOGY, INC. 发明人 CHOPRA, DINESH
分类号 B24B37/04;C09K3/14;C09K13/04;H01L21/304;H01L21/321;(IPC1-7):H01L21/321 主分类号 B24B37/04
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