发明名称 Electric potential measurement method using Pockel's effect
摘要 The method involves using a Pockel crystal (12) into which first and second polarised light beam (4,6) are coupled. The first and second light beams (4a), which emerge from the crystal are, redirected by a multiple inner total reflection. The light beams are phase shifted with respect to each other about an odd multiple of lambda/4 by an inner total reflection of at least one emerged light beam. The beams are then coupled again into the Pockel crystal. At least a triple inner total reflection of at least one emerged light beam is carried out for the phase shift.
申请公布号 DE19952265(A1) 申请公布日期 2000.05.18
申请号 DE19991052265 申请日期 1999.10.29
申请人 SIEMENS AG 发明人 KRAEMMER, PETER
分类号 G01R15/24;G02F1/03;(IPC1-7):G01R15/24 主分类号 G01R15/24
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