发明名称 METHOD AND APPARATUS FOR WIRELESS RADIO FREQUENCY TESTING OF RFID INTEGRATED CIRCUITS
摘要 <p>A method and apparatus for wireless radio frequency (RF) testing of radio frequency identification integrated circuits (RFID IC) is disclosed. A fixture is provided for physically and electrically contacting the RFID IC to feed an RF interrogating signal into the RFID IC and receive an RF return signal generated in response thereto. The fixture is coupled to a tester via first and second couplers (interconnected to the fixture and tester, respectively) which establish a wireless link for transmitting and receiving the RF interrogation signal and the RF return signal thereby allowing full and accurate RF characterization of the RFID IC.</p>
申请公布号 WO2000028339(A1) 申请公布日期 2000.05.18
申请号 US1999025914 申请日期 1999.11.03
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