发明名称 Energy absorbing structures to prevent damage to an integrated circuit
摘要 The present invention provides in one embodiment thereof an integrated circuit (IC). The IC includes a silicon substrate and a dielectric layer formed upon the silicon substrate. The IC further includes a terminal metal layer (TML) formed upon the dielectric layer. The dielectric layer and the TML form a die active area. The IC also includes a first guard ring formed out of the TML. The first guard encloses the die active area. Furthermore the IC includes a second guard ring formed out of the TML. The second guard ring encloses the first guard ring.
申请公布号 GB0007668(D0) 申请公布日期 2000.05.17
申请号 GB20000007668 申请日期 1998.06.29
申请人 INTEL CORPORATION 发明人
分类号 H01L23/58 主分类号 H01L23/58
代理机构 代理人
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