发明名称 Metal locking structures to prevent a passivation layer from delaminating
摘要 An integrated circuit (IC) is provided. The IC includes a silicon substrate and a dielectric layer formed upon the silicon substrate. The IC further includes a terminal metal layer (TML) formed upon the dielectric layer. The dielectric layer and the TML form a die active area. The TML has formed therein a plurality of spaced locking structures. The plurality of space locking structures are electrically isolated therebetween. Each locking structure is formed outside the die active area. The IC further includes a passivation layer adhering to the locking structures.
申请公布号 GB0007667(D0) 申请公布日期 2000.05.17
申请号 GB20000007667 申请日期 1998.06.29
申请人 INTEL CORPORATION 发明人
分类号 H01L23/31;H01L23/58 主分类号 H01L23/31
代理机构 代理人
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