| 摘要 |
PROBLEM TO BE SOLVED: To obtain an inspection structure for circuit protective element which allows a circuit protective element to be able to be inspected surely for normal operation and, at the same time, a high-quality product to be able to be manufactured inexpensively. SOLUTION: In an inspection structure for circuit protective element in which the paired lead terminals 8 and 8 of a circuit protective element 7 are respectively connected and fixed to the conductive plate 3 of a conductive circuit 2 patterned on a circuit board 1, and the element 7 is inspected for normal operation by means of an inspection probe 4 to which a large current is made to flow; probe contacting sections 5 thicker than the conductive plate 3 are formed by soldering test pads 6 with which the probe 4 is brought into contact to the plate 3. The test pads 6 are made smaller than the surface of the plate 3 and arranged near the lead terminals 8. In addition, the pads 6 have the same shape and are composed of pluralities of contacting members so that the contacting areas of the pads 6 with the probe 4 may be fixed. The contacting members are equally arranged on one surface of the plate 3 and, at the same time, formed by directly projecting solder bump. The solder bumps are formed at the opening of the through hole of the conductive plate 3 by filling up the hole with solder.
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