发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing an FET(field effect transistor) where an LDD(lightly-doped drain) occurrence is dissolved, wherein the channel of the FET is restrained from becoming asymmetrical, and a salicide technology can be easily applied. SOLUTION: This manufacturing method comprises a process, where an insulating film 12 is deposited after a gate electrode 3 is formed, and sidewalls 15 and 16 formed of the above insulating film 12 are each formed on the sides of the gate electrode 3 through anisotropic etching. In this case, the insulation film is deposited after the gate electrode 3 is formed, then anisotropic etching is carried out tilting a substrate 1 at the same angle as the angle of ion implantation carried out for the formation of source/drain regions 5 and 6 to form the sidewalls 15 and 16 so as to be bilaterally asymmetrical, whereby the sidewall 15 is set thicker than the side wall 16.
申请公布号 JP2000138369(A) 申请公布日期 2000.05.16
申请号 JP19980309297 申请日期 1998.10.30
申请人 SHARP CORP 发明人 URABE DAIZO
分类号 H01L29/78;H01L21/336;(IPC1-7):H01L29/78 主分类号 H01L29/78
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