发明名称 |
Selective PVD growth of copper on patterned structures by selectively resputtering and sputtering areas of a substrate |
摘要 |
Features, e.g., vias or lines, are formed of copper by using selective PVD growth. A patterned structure is formed having a underlayer of a material that will accumulate copper by sputtering. An overlayer resputters the copper so that it does not accumulate a layer of copper. Copper is resputtered onto the underlayer using a sputtering ion that has a higher molecular weight than the copper. Copper is used to fill the gap defining the desired feature, and to cover an overlayer. Polishing and etchback are then used to remove the resputtered thin material and remove all of the copper on the upper surface, leaving the copper feature.
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申请公布号 |
US6063707(A) |
申请公布日期 |
2000.05.16 |
申请号 |
US19960730038 |
申请日期 |
1996.10.11 |
申请人 |
CALIFORNIA INSTITUTE OF TECHNOLOGY;INTEL CORPORATION |
发明人 |
ATWATER, HARRY A.;GARDNER, DONALD S. |
分类号 |
H01L21/285;H01L21/768;(IPC1-7):H01L21/44 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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