发明名称 Mosfet with raised source and drain regions
摘要 A semiconductor substrate having a surface, a field oxide region at the surface and a gate structure above the surface are provided. A sidewall spacer is formed adjacent to the gate structure and a polysilicon layer is formed above the substrate, the polysilicon layer having raised first and second portions above the gate structure and field oxide region, respectively. A masking layer is formed above the polysilicon layer and then blanket etched to expose the raised first and second portions of the polysilicon layer which are subsequently removed to form a raised source/drain region from the polysilicon layer. Since the raised source/drain region is fabricated without using photolithography, high density MOSFETs are readily fabricated.
申请公布号 US6063676(A) 申请公布日期 2000.05.16
申请号 US19970871139 申请日期 1997.06.09
申请人 INTEGRATED DEVICE TECHNOLOGY, INC. 发明人 CHOI, JEONG YEOL;HAN, CHUNG-CHYUNG;MUI, KEN-CHUEN
分类号 H01L21/225;H01L21/336;H01L21/768;(IPC1-7):H01L21/336 主分类号 H01L21/225
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