发明名称 |
Mosfet with raised source and drain regions |
摘要 |
A semiconductor substrate having a surface, a field oxide region at the surface and a gate structure above the surface are provided. A sidewall spacer is formed adjacent to the gate structure and a polysilicon layer is formed above the substrate, the polysilicon layer having raised first and second portions above the gate structure and field oxide region, respectively. A masking layer is formed above the polysilicon layer and then blanket etched to expose the raised first and second portions of the polysilicon layer which are subsequently removed to form a raised source/drain region from the polysilicon layer. Since the raised source/drain region is fabricated without using photolithography, high density MOSFETs are readily fabricated.
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申请公布号 |
US6063676(A) |
申请公布日期 |
2000.05.16 |
申请号 |
US19970871139 |
申请日期 |
1997.06.09 |
申请人 |
INTEGRATED DEVICE TECHNOLOGY, INC. |
发明人 |
CHOI, JEONG YEOL;HAN, CHUNG-CHYUNG;MUI, KEN-CHUEN |
分类号 |
H01L21/225;H01L21/336;H01L21/768;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/225 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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