发明名称 MANUFACTURE OF RIDGE TYPE SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To leave a first photoresist film in a ridge area when an opening is formed in a prescribed pattern by exposing and developing a second photoresist film, by forming a photoresist film having different fusibility from that the first photoresist film has as the second photoresist film. SOLUTION: After a first photoresist film 24 is formed on an insulating film 23 formed on a substrate 20, a second photoresist film 25 is formed on the whole surface of the film 24. Then a mask 25 is formed in a prescribed pattern having an opening 26 for exposing the first photoresist film 24 on a ridge 22 by exposing and developing the second photoresist film 25. The first and second photoresist films 24 and 25 are respectively formed of negative- and positive-type resists. In developing the second photoresist film 25, therefore, the first photoresist film 24 is not dissolved by the developing solution, but is left with a film thickness which is nearly equal to that when deposited.
申请公布号 JP2000138416(A) 申请公布日期 2000.05.16
申请号 JP19980309807 申请日期 1998.10.30
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 YOSHIDA JIYUNJI;YABUSAKI KEIICHI;TSUKIJI NAOKI
分类号 H01L21/027;H01L31/10;H01S5/00;H01S5/20;H01S5/22;H01S5/223;(IPC1-7):H01S5/22 主分类号 H01L21/027
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