POLARIZATION MEASURING APPARATUS

摘要

PROBLEM TO BE SOLVED: To provide a polarization analyzer which is provided with a small and simple optical system and to provide a structure for a sample support which is suitable for the optical system. SOLUTION: An optical system is provided with a polarization beam splitter 1 by which polarized light is made incident on a part of a sample 3. In addition, it is provided with a nonpolarization prism 7 which does not change the phase difference between p-polarized light and s-polarized light by reflected light which is reflected by a part of the sample 3 and which has a shape which makes the reflected light incident on a part which is different from a part of the sample 3. Light from the nonpolarization prism 7 is reflected by another part of the sample 3 so as to be incident on the polarization beam splitter 1. In addition, a quarter-wave plate 5 is arranged at the front of the nonpolarization plate 7 so as to be tilted at 45 deg. with reference to an optical axis in such a way that the phase difference between the p-polarized light and the s-polarized light becomes 45 deg..