发明名称 Tester systems
摘要 A tester for use with a device under test includes a processor, a signal timing editor to create representations of signal waveforms and associated times, and a test program executable on the processor that schedules events based on information from the signal timing editor. The test program schedules different delays for the events to compensate for variations in time delays between different signals coupled to the device under test.
申请公布号 US6064948(A) 申请公布日期 2000.05.16
申请号 US19980033364 申请日期 1998.03.02
申请人 TANISYS TECHNOLOGY, INC. 发明人 WEST, MICHAEL S.;LAWRENCE, ARCHER R.;HUNTER, PAUL R.;LITTLE, JACK C.
分类号 G01R31/3183;G01R31/319;(IPC1-7):G01R31/26 主分类号 G01R31/3183
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