发明名称 |
METHOD FOR FORMING STORAGE ELECTRODE OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A storage electrode formation method is provided to improve process margin by removing a step between a peripheral region and a cell region using a core oxide. CONSTITUTION: An interlayer dielectric(13) having a storage contact hole is formed on a semiconductor substrate(11) defined by a peripheral region and a cell region. A conductive layer is formed on the interlayer dielectric(13) to filled into the contact hole. A core oxide(17) is formed on entire surface of the resultant structure and etched using a photoresist pattern as a mask. A storage electrode side walls (19) is formed at both side walls and connected to the conductive layer.
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申请公布号 |
KR20000027630(A) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19980045585 |
申请日期 |
1998.10.28 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
AHN, JUNG JIN;KIM, YOUNG SEOK |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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