发明名称 |
METHOD OF MANUFACTURING PATTERN OF SEMICONDUCTOR DEVICE USING PHOTOSENSITIVE MATERIAL |
摘要 |
PURPOSE: A method of manufacturing a pattern of a semiconductor device using photosensitive material is provided to simplify the manufacturing process with a low cost. CONSTITUTION: A method of manufacturing a pattern of a semiconductor device using photosensitive material comprises the steps of: forming a photosensitive layer including photosensitive material on a semiconductor substrate; irradiating light source to a part of the photosensitive layer; eliminating the light-irradiated part of the photosensitive layer by a developing process and forming a pattern manufacturing part by the remained photosensitive layer; and eliminating the photosensitive material included in the pattern manufacturing part.
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申请公布号 |
KR20000026353(A) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19980043861 |
申请日期 |
1998.10.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
NO, HYEONG JU |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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