发明名称 SEMICONDUCTOR ELENENT MANUFACTURING METHOD
摘要 PURPOSE: A method for fabricating a semiconductor device is to induce a free electron or positive ion at a surface of a trench for device isolation, thereby decreasing a leakage current. CONSTITUTION: A trench is respectively formed at a P-well region and an N-well region of a semiconductor substrate. The semiconductor substrate including the trench is oxidized and thus the first oxidation layer is formed on the surface of the semiconductor substrate including the trench. A negative fixed oxidation charge is accumulated in the first oxidation layer of the P-well region. A positive fixed oxidation charge is accumulated in the first oxidation layer of the N-well region. The trenches are filled with the second oxidation layer by a CVD method. The resultant substrate is etched back until the surface of the semiconductor substrate is exposed.
申请公布号 KR100256824(B1) 申请公布日期 2000.05.15
申请号 KR19970081277 申请日期 1997.12.31
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD. 发明人 CHOI, DEEK SUNG
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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