发明名称 |
SEMICONDUCTOR ELENENT MANUFACTURING METHOD |
摘要 |
PURPOSE: A method for fabricating a semiconductor device is to induce a free electron or positive ion at a surface of a trench for device isolation, thereby decreasing a leakage current. CONSTITUTION: A trench is respectively formed at a P-well region and an N-well region of a semiconductor substrate. The semiconductor substrate including the trench is oxidized and thus the first oxidation layer is formed on the surface of the semiconductor substrate including the trench. A negative fixed oxidation charge is accumulated in the first oxidation layer of the P-well region. A positive fixed oxidation charge is accumulated in the first oxidation layer of the N-well region. The trenches are filled with the second oxidation layer by a CVD method. The resultant substrate is etched back until the surface of the semiconductor substrate is exposed.
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申请公布号 |
KR100256824(B1) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19970081277 |
申请日期 |
1997.12.31 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD. |
发明人 |
CHOI, DEEK SUNG |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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