发明名称 |
METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A cylindrical capacitor formation method having double side walls is provided to enhance surface area of capacitor and prevent a bridge by dividing upper portion of the double side walls using CMP(chemical mechanical polishing). CONSTITUTION: A first interlayer dielectric(25) is formed on a semiconductor substrate(20) having transistors. After etching a portion of the first interlayer dielectric(25), a first conductive layer and a second interlayer dielectric(27) are sequentially formed. Then, by etching the second interlayer dielectric(27), spacers are formed at side walls of the first conductive layer(25). After forming a storage contact hole, a second conductive layer is filled into the contact hole. After forming a third interlayer dielectric on the resultant structure, the third interlayer dielectric, the second and the first conductive layers are removed by using CMP, thereby forming double storage electrode side walls.
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申请公布号 |
KR20000027637(A) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19980045592 |
申请日期 |
1998.10.28 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
CHOE, YONG JIN;HEO, YONG JIN |
分类号 |
H01L27/10;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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