发明名称 METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICES
摘要 PURPOSE: A cylindrical capacitor formation method having double side walls is provided to enhance surface area of capacitor and prevent a bridge by dividing upper portion of the double side walls using CMP(chemical mechanical polishing). CONSTITUTION: A first interlayer dielectric(25) is formed on a semiconductor substrate(20) having transistors. After etching a portion of the first interlayer dielectric(25), a first conductive layer and a second interlayer dielectric(27) are sequentially formed. Then, by etching the second interlayer dielectric(27), spacers are formed at side walls of the first conductive layer(25). After forming a storage contact hole, a second conductive layer is filled into the contact hole. After forming a third interlayer dielectric on the resultant structure, the third interlayer dielectric, the second and the first conductive layers are removed by using CMP, thereby forming double storage electrode side walls.
申请公布号 KR20000027637(A) 申请公布日期 2000.05.15
申请号 KR19980045592 申请日期 1998.10.28
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 CHOE, YONG JIN;HEO, YONG JIN
分类号 H01L27/10;(IPC1-7):H01L27/10 主分类号 H01L27/10
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