发明名称 METHOD FOR MANUFACTURING CONTACT OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a contact of a semiconductor device is provided to prevent defects beforehand by simplifying a manufacturing process and securing a process margin. CONSTITUTION: A method for manufacturing a contact of a semiconductor device comprises the steps of: applying a first insulation layer(14) on a semiconductor substrate having a conductive layer pattern, the first insulation layer not being planarized completely; applying a second insulation layer(15) having a different etching rate from that of the first insulation layer, on the entire structure according to the topology of the first insulation layer; forming a residue of the second insulation layer on the side wall of the first insulation layer by etching-back the second insulation layer; and exposing the semiconductor substrate by forming a contact mask pattern and etching the first insulation layer and the residue.
申请公布号 KR20000027374(A) 申请公布日期 2000.05.15
申请号 KR19980045290 申请日期 1998.10.28
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 LEE, SEONG GWON
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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