发明名称 |
METHOD FOR MANUFACTURING CONTACT OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a contact of a semiconductor device is provided to prevent defects beforehand by simplifying a manufacturing process and securing a process margin. CONSTITUTION: A method for manufacturing a contact of a semiconductor device comprises the steps of: applying a first insulation layer(14) on a semiconductor substrate having a conductive layer pattern, the first insulation layer not being planarized completely; applying a second insulation layer(15) having a different etching rate from that of the first insulation layer, on the entire structure according to the topology of the first insulation layer; forming a residue of the second insulation layer on the side wall of the first insulation layer by etching-back the second insulation layer; and exposing the semiconductor substrate by forming a contact mask pattern and etching the first insulation layer and the residue.
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申请公布号 |
KR20000027374(A) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19980045290 |
申请日期 |
1998.10.28 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
LEE, SEONG GWON |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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