发明名称 |
MEASURING SYSTEM OF PANEL FOR CATHODE RAY TUBE |
摘要 |
PURPOSE: A measuring system of a panel for a cathode ray tube is provided to perform measurement of a panel without collecting a sample to judge the pass of the measurement result rapidly,to improve the accuracy of the measurement. CONSTITUTION: A centering apparatus(100) sets a center of a panel on a table by rolling from all directions, and the panel is moved to a measuring position of a first and a second measuring apparatus(300,500) by a sending apparatus(200). The first measuring apparatus detects the dimension of the panel by performing a three dimensional measurement by moving a probe up and down and rotating the probe. The second measuring apparatus measures the shape and the roughness of the panel before and after the polishing by the driving of a first and a second measuring unit, and a series of the measuring processes are controlled by a computer.
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申请公布号 |
KR20000026178(A) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19980043599 |
申请日期 |
1998.10.19 |
申请人 |
CHANG, PAHN SHICK;LIM SANG BIN |
发明人 |
KIM, BYUNG SEUB;CHOI, YOUNG RAK |
分类号 |
H01J9/42;(IPC1-7):H01J9/42 |
主分类号 |
H01J9/42 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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