发明名称 |
METHOD OF FORMING CONTACT HOLE IN SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a contact hole is to improve the reliability of a device by forming a contact hole having a wide opening without performing a wet etching process. CONSTITUTION: The first BPSG(borophosphosilicate glass) layer(21) is formed on a semiconductor substrate(20) having a predetermined lower layer. The first BPSG layer is partially etched by a dry etching process, using the first etching mask. The second BPSG layer is formed on the resultant structure, and is flowed by performing a flow thermal process. The second BPSG layer is etched in the entire surface thereof by a dry etching process, thereby forming the first contact hole having a hemisphere groove shape. A photoresist is formed on the resultant structure. A photoresist pattern is formed to coat an end of the first contact hole by using the second mask. The second contact hole is formed to expose a part of the semiconductor substrate by selectively etching the first BPSG layer in the first contact hole. A wineglass type contact hole is formed by removing the remaining photoresist pattern.
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申请公布号 |
KR100256231(B1) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19970029032 |
申请日期 |
1997.06.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD. |
发明人 |
HORSHAM, ROY J.B. |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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