发明名称 METHOD OF FORMING CONTACT HOLE IN SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a contact hole is to improve the reliability of a device by forming a contact hole having a wide opening without performing a wet etching process. CONSTITUTION: The first BPSG(borophosphosilicate glass) layer(21) is formed on a semiconductor substrate(20) having a predetermined lower layer. The first BPSG layer is partially etched by a dry etching process, using the first etching mask. The second BPSG layer is formed on the resultant structure, and is flowed by performing a flow thermal process. The second BPSG layer is etched in the entire surface thereof by a dry etching process, thereby forming the first contact hole having a hemisphere groove shape. A photoresist is formed on the resultant structure. A photoresist pattern is formed to coat an end of the first contact hole by using the second mask. The second contact hole is formed to expose a part of the semiconductor substrate by selectively etching the first BPSG layer in the first contact hole. A wineglass type contact hole is formed by removing the remaining photoresist pattern.
申请公布号 KR100256231(B1) 申请公布日期 2000.05.15
申请号 KR19970029032 申请日期 1997.06.30
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD. 发明人 HORSHAM, ROY J.B.
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址